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C2-1000N

From the C2 series

C2: sensors and measurement devices by HBK for force.

Force range
0–1000 N
This series on the HBK site (opens in a new tab)

Technical specification

Every engineering figure, laid out to scan quickly

Technical specification for C2-1000N
Force range 0–1000 N
Accuracy (% FSO) 0.2 %
Protection class (DIN EN 60529) IP67
Technical specification details 1000 N rated capacity = 1 kN (101.9716 kg mass equivalent at standard gravity); compression
Ordering options and constraints K-C2- — capacity: 112 lbf, 225 lbf, 450 lbf, 1.12 klbf, 2.25 klbf, 4.5 klbf, 11.2 klbf, 22.5 klbf, 45 klbf; output_signal: mV/V (passive strain gauge), Voltage (0…10V), Current (4-20mA), IO-Link; height_without_accessories: 1.18 in, 1.89 in, 2.36 in; diameter_without_cable_or_plug: 4.52755 in, 1.9685 in, 3.5433 in; constraints: []

Values by configuration

These values differ with the controller or interface the sensor is used with. Each row applies to one configuration only; check the configuration in the system builder or with us.

ADC sampling rate 40000 samples/s
ADC sampling rate 1111 samples/s
ADC sampling rate 19200 samples/s
ADC sampling rate 450 samples/s
Interfaces Ethernet
Interfaces EtherCAT
Interfaces IO-Link
Interfaces PROFINET
Operating temperature -10–60 °C
Operating temperature -20–60 °C
Operating temperature -30–85 °C
Outputs and interfaces Analog 0-10V
Outputs and interfaces Digital I/O
Outputs and interfaces 4-20mA
Outputs and interfaces RS422 / RS485
Sampling rate reference ClipX fixed internal sampling rate; verify the configured filter and usable output bandwidth
Sampling rate reference The analog output bandwidth and configured filter define usable dynamics; no unsupported digital rate is asserted
Sampling rate reference 0.9 ms minimum IO-Link process-data cycle; the sensor electronics sample internally at 40 kHz
Sampling rate reference MX840B maximum per-channel sample rate; sensor mechanics and filter settings can reduce usable bandwidth
Sampling rate reference DMP41 selectable result rate, intended for reference and calibration measurements
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